4.7: References
- Page ID
- 41112
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\(\newcommand{\avec}{\mathbf a}\) \(\newcommand{\bvec}{\mathbf b}\) \(\newcommand{\cvec}{\mathbf c}\) \(\newcommand{\dvec}{\mathbf d}\) \(\newcommand{\dtil}{\widetilde{\mathbf d}}\) \(\newcommand{\evec}{\mathbf e}\) \(\newcommand{\fvec}{\mathbf f}\) \(\newcommand{\nvec}{\mathbf n}\) \(\newcommand{\pvec}{\mathbf p}\) \(\newcommand{\qvec}{\mathbf q}\) \(\newcommand{\svec}{\mathbf s}\) \(\newcommand{\tvec}{\mathbf t}\) \(\newcommand{\uvec}{\mathbf u}\) \(\newcommand{\vvec}{\mathbf v}\) \(\newcommand{\wvec}{\mathbf w}\) \(\newcommand{\xvec}{\mathbf x}\) \(\newcommand{\yvec}{\mathbf y}\) \(\newcommand{\zvec}{\mathbf z}\) \(\newcommand{\rvec}{\mathbf r}\) \(\newcommand{\mvec}{\mathbf m}\) \(\newcommand{\zerovec}{\mathbf 0}\) \(\newcommand{\onevec}{\mathbf 1}\) \(\newcommand{\real}{\mathbb R}\) \(\newcommand{\twovec}[2]{\left[\begin{array}{r}#1 \\ #2 \end{array}\right]}\) \(\newcommand{\ctwovec}[2]{\left[\begin{array}{c}#1 \\ #2 \end{array}\right]}\) \(\newcommand{\threevec}[3]{\left[\begin{array}{r}#1 \\ #2 \\ #3 \end{array}\right]}\) \(\newcommand{\cthreevec}[3]{\left[\begin{array}{c}#1 \\ #2 \\ #3 \end{array}\right]}\) \(\newcommand{\fourvec}[4]{\left[\begin{array}{r}#1 \\ #2 \\ #3 \\ #4 \end{array}\right]}\) \(\newcommand{\cfourvec}[4]{\left[\begin{array}{c}#1 \\ #2 \\ #3 \\ #4 \end{array}\right]}\) \(\newcommand{\fivevec}[5]{\left[\begin{array}{r}#1 \\ #2 \\ #3 \\ #4 \\ #5 \\ \end{array}\right]}\) \(\newcommand{\cfivevec}[5]{\left[\begin{array}{c}#1 \\ #2 \\ #3 \\ #4 \\ #5 \\ \end{array}\right]}\) \(\newcommand{\mattwo}[4]{\left[\begin{array}{rr}#1 \amp #2 \\ #3 \amp #4 \\ \end{array}\right]}\) \(\newcommand{\laspan}[1]{\text{Span}\{#1\}}\) \(\newcommand{\bcal}{\cal B}\) \(\newcommand{\ccal}{\cal C}\) \(\newcommand{\scal}{\cal S}\) \(\newcommand{\wcal}{\cal W}\) \(\newcommand{\ecal}{\cal E}\) \(\newcommand{\coords}[2]{\left\{#1\right\}_{#2}}\) \(\newcommand{\gray}[1]{\color{gray}{#1}}\) \(\newcommand{\lgray}[1]{\color{lightgray}{#1}}\) \(\newcommand{\rank}{\operatorname{rank}}\) \(\newcommand{\row}{\text{Row}}\) \(\newcommand{\col}{\text{Col}}\) \(\renewcommand{\row}{\text{Row}}\) \(\newcommand{\nul}{\text{Nul}}\) \(\newcommand{\var}{\text{Var}}\) \(\newcommand{\corr}{\text{corr}}\) \(\newcommand{\len}[1]{\left|#1\right|}\) \(\newcommand{\bbar}{\overline{\bvec}}\) \(\newcommand{\bhat}{\widehat{\bvec}}\) \(\newcommand{\bperp}{\bvec^\perp}\) \(\newcommand{\xhat}{\widehat{\xvec}}\) \(\newcommand{\vhat}{\widehat{\vvec}}\) \(\newcommand{\uhat}{\widehat{\uvec}}\) \(\newcommand{\what}{\widehat{\wvec}}\) \(\newcommand{\Sighat}{\widehat{\Sigma}}\) \(\newcommand{\lt}{<}\) \(\newcommand{\gt}{>}\) \(\newcommand{\amp}{&}\) \(\definecolor{fillinmathshade}{gray}{0.9}\)[1] R. Hackborn, “An automatic network analyzer system,” Microwave Journal, pp. 45–52, May 1968.
[3] G. Engen and C. Hoer, “Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer,” IEEE Trans. on Microwave Theory and Techniques, vol. 27, no. 12, pp. 987–993, Dec. 1979.
[4] S. Goldberg, M. Steer, P. Franzon, and J. Kasten, “Experimental electrical characterization of interconnects and discontinuities in highspeed digital systems,” IEEE Trans. on Components, Hybrids, and Manufacturing Technology, vol. 14, no. 4, pp. 761–765, Dec. 1991.
[5] M. Steer, S. Goldberg, G. Rinne, P. Franzon, I. Turlik, and J. Kasten, “Introducing the through-line deembedding procedure,” in 1992 IEEE MTT-S Int. Microwave Symp. Dig.,, Jun. 1992, pp. 1455–1458.
[6] J. Hunton, “Analysis of microwave measurement techniques by means of signal flow graphs,” IRE Trans. on Microwave Theory and Techniques, vol. 8, no. 2, pp. 206–212, Mar. 1960.
[7] J. Fitzpatrick, “Error models for systems measurement,” Microwave Journal, pp. 63–66, may 1978.
[8] A. A. M. Saleh, “Explicit formulas for error correction in microwave measuring sets with switching-dependent port mismatches,” IEEE Trans. on Instrumentation and Measurement, vol. 28, no. 1, pp. 67–71, Mar. 1979.
[9] H. Shurmer, “Calibration procedure for computer-corrected s parameter characterisation of devices mounted in microstrip,” Electronics Letters, vol. 9, no. 14, pp. 323–324, 12 1973.
[10] De-embedding and Embedding S-paramater Networks Using a Vector Network Analyzer, May 2004, agilent Application Note 1363–1.
[11] J. Butler, D. Rytting, M. Iskander, R. Pollard, and M. Vanden Bossche, “16-term error model and calibration procedure for on-wafer network analysis measurements,” IEEE Trans. on Microwave Theory and Techniques, vol. 39, no. 12, pp. 2211–2217, Dec. 1991.
[12] B. Bianco, M. Parodi, S. Ridella, and F. F. Selvaggi, “Launcher and microstrip characterization,” IEEE Trans. on Instrumentation and Measurement, vol. 25, no. 4, pp. 320–323, Dec. 1976.
[13] C. Hoer, “Choosing line lengths for calibrating network analyzers,” IEEE Trans. on Microwave Theory and Techniques, vol. 31, no. 1, pp. 76–78, Jan. 1983.
[14] C. A. Hoer, “Some questions and answers concerning air lines as impedance standards,” in 29th ARFTG Conf. Digest-Spring, vol. 11, Jun. 1987, pp. 161–173.
[15] P. Buff, “Characterization of propagation on wires over lossy earth,” Ph.D. dissertation, North Carolina State University, 2006.
[16] P. Buff, J. Nath, and M. Steer, “Origin of the half-wavelength errors in microwave measurements using through-line calibrations,” IEEE Trans. on Instrumentation and Measurement, vol. 56, no. 5, pp. 1610–1615, Oct. 2007.
[17] R. Marks, “A multiline method of network analyzer calibration,” IEEE Trans. on Microwave Theory and Techniques, vol. 39, no. 7, pp. 1205–1215, Jul. 1991.
[18] D. Williams, “De-embedding and unterminating microwave fixtures with nonlinear least squares,” IEEE Trans. on Microwave Theory and Techniques, vol. 38, no. 6, pp. 787–791, Jun. 1990.
[19] N. R. Franzen and R. A. Speciale, “A new procedure for system calibration and error removal in automated s-parameter measurements,” in 5th European Microwave Conf., Sep. 1975, pp. 69–73.
[20] J. Benet, “The design and calibration of a universal MMIC test fixture,” in Microwave and Millimeter-Wave Monolithic Circuits, vol. 82, no. 1, Jun. 1982, pp. 36–41.
[21] S. R. Pennock, C. M. D. Rycroft, P. R. Shepherd, and T. Rozzi, “Transition characterisation for de-embedding purposes,” in 17th European Microwave Conf., Sep. 1987, pp. 355– 360.
[22] W. Eisenstadt and Y. Eo, “S-parameter-based ic interconnect transmission line characterization,” IEEE Trans. on Components, Hybrids, and Manufacturing Technology, vol. 15, no. 4, pp. 483–490, Aug. 1992.
[23] Yungseon Eo, W. Eisenstadt, and Jongin Shim, “S-parameter-measurement-based high-speed signal transient characterization of vlsi interconnects on sio2-si substrate,” IEEE Trans. on Advanced Packaging, vol. 23, no. 3, pp. 470–479, Aug. 2000.
[24] Yungseon Eo and W. Eisenstadt, “Highspeed vlsi interconnect modeling based on s-parameter measurements,” IEEE Trans. on Components, Hybrids, and Manufacturing Technology, vol. 16, no. 5, pp. 555–562, Aug. 1993.
[25] R. Amaudov and R. Borisov, “S-parametersbased extraction of effective dielectric constant in transmission lines on multilayer substrates,” in Telecommunications Forum (TELFOR), 2011 19th, Nov. 2011, pp. 900–903.