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5.7: References

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[1] M. Odyniec, Ed., RF and Microwave Oscillator Design. Artech House, 2002.

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[6] M. Tiebout, Low Power VCO Design in CMOS. Springer, 2006.

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[29] T. Lee and A. Hajimiri, “Oscillator phase noise: a tutorial,” IEEE J. of Solid-State Circuits, vol. 35, no. 3, pp. 326–336, Mar. 2000.

[30] S. Kogan, Electronic Noise and Fluctuations in Solids. Cambridge University Press, 1996.

[31] A. Hajimiri and T. Lee, “A general theory of phase noise in electrical oscillators,” IEEE J. of Solid-State Circuits, vol. 33, no. 2, pp. 179– 194, Feb. 1998.

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[33] ——, “Corrections to ”a general theory of phase noise in electrical oscillators”,” IEEE J. of Solid-State Circuits, vol. 33, no. 6, p. 928, Jun. 1998.

[34] G. Wornell and A. Oppenheim, Signal Processing with Fractals: A Wavelet-Based Approach. Prentice Hall, 1996.

[35] G. Wornell, “Wavelet-based representations for the 1/f family of fractal processes,” Proc. of the IEEE, vol. 81, no. 10, pp. 1428–1450, Oct. 1993.

[36] N. Kriplani, “Modelling colored noise under large-signal conditions,” Ph.D. dissertation, North Carolina State University, 2005.

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[38] B. Mandelbrot, The Fractal Geometry of Nature. Times Books, 1982.

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[44] R. Bhansali, M. Holland, and P. Kokoszka, “Chaotic maps with slowly decaying correlations and intermittency,” in Fields Institute Communications: Asymptotic Methods in Stochastics, L. Horv´ath and B. Szyszkowicz, Eds., 2004, p. •.

[45] R. May, “Simple mathematical models with very complicated dynamics,” Nature, vol. 261, no. 5560, pp. 459–467, June 1976.

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[48] E. Simoen, A. Mercha, L. Pantisano, C. Claeys, and E. Young, “Low-frequency noise behavior of SiO2–HfO2 dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness,” IEEE Trans. on Electron Devices, vol. 51, no. 5, pp. 780–784, May 2004.

[49] F. Hooge, T. Kleinpenning, and L. Vandamme, “•experimental studies on 1/f noise,” Reports on Progress in Physics, 1981.

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[51] E. Bibbona, G. Panfilo, and P. Tavella, “The ornstein-uhlenbeck process as a model of a low pass filtered white noise,” Metrologia, vol. 45, no. 6, pp. S117–S126, Dec. 2008.

[52] A. Suarez, Analysis and Design of Autonomous Microwave Circuits. John Wiley & Sons, Inc., 2009.

[53] A. Hati, C. Nelson, and D. Howe, “Effect of vibration on P and AM noise of oscillatory and non-oscillatory components at 10 GHz,” in 2009 IEEE Int. Frequency Control Symp., Joint with the 22nd European Frequency and Time Forum, Apr. 2009, pp. 524–529.

[54] W. Robins, Phase Noise in Signal Sources. Peter Peregrinus Ltd., 1982.

[55] M. Buckingham, Noise in Electronic Devices and Systems. Ellis Horwood, 1983.

[56] P. Antognetti and G. Massobrio, Semiconductor Device Modeling with SPICE. McGrawHill, 1988.

[57] A. van der Ziel, X. Zhang, and A. Pawlikiewicz, “Location of 1/f noise sources in BJT’s and HBJT’s—i. theory,” IEEE Trans. on Electron Devices, vol. 33, no. 9, pp. 1371–1376, Sep. 1986.

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5.7: References is shared under a CC BY-NC 4.0 license and was authored, remixed, and/or curated by LibreTexts.

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