Skip to main content
Engineering LibreTexts

3.9: Other Artefacts

  • Page ID
    19842
  • \( \newcommand{\vecs}[1]{\overset { \scriptstyle \rightharpoonup} {\mathbf{#1}} } \) \( \newcommand{\vecd}[1]{\overset{-\!-\!\rightharpoonup}{\vphantom{a}\smash {#1}}} \)\(\newcommand{\id}{\mathrm{id}}\) \( \newcommand{\Span}{\mathrm{span}}\) \( \newcommand{\kernel}{\mathrm{null}\,}\) \( \newcommand{\range}{\mathrm{range}\,}\) \( \newcommand{\RealPart}{\mathrm{Re}}\) \( \newcommand{\ImaginaryPart}{\mathrm{Im}}\) \( \newcommand{\Argument}{\mathrm{Arg}}\) \( \newcommand{\norm}[1]{\| #1 \|}\) \( \newcommand{\inner}[2]{\langle #1, #2 \rangle}\) \( \newcommand{\Span}{\mathrm{span}}\) \(\newcommand{\id}{\mathrm{id}}\) \( \newcommand{\Span}{\mathrm{span}}\) \( \newcommand{\kernel}{\mathrm{null}\,}\) \( \newcommand{\range}{\mathrm{range}\,}\) \( \newcommand{\RealPart}{\mathrm{Re}}\) \( \newcommand{\ImaginaryPart}{\mathrm{Im}}\) \( \newcommand{\Argument}{\mathrm{Arg}}\) \( \newcommand{\norm}[1]{\| #1 \|}\) \( \newcommand{\inner}[2]{\langle #1, #2 \rangle}\) \( \newcommand{\Span}{\mathrm{span}}\)\(\newcommand{\AA}{\unicode[.8,0]{x212B}}\)

    Feedback related

    The feedback is supposed to keep the tip-sample interaction at a fixed setpoint by adjusting the z height of the probe, as discussed earlier. However if the scan speed across the sample is fast, then the feedback may not be able to react quickly enough and tracking is poor. This can be seen by comparing the trace and retrace (forward and backward direction) for a single line in the scan. The following image shows the height and amplitude trace (white) and retrace (yellow) when tracking is good. The height trace and retrace are almost identical, and the amplitude retrace is a mirror image of the trace because it is in the opposite direction.

    Image of trace and retrace

    When tracking is poor, the trace and retrace of height no longer overlap. Blurred images result. This can happen because the gains are set too low, or the scan speed is too high.

    Image showing poor tracking

    The images below are examples of poor tracking

    poor_tracking_topography.jpg poor_tracking_amplitude_error.jpg

    Topography

    Amplitude error

    With sharp slopes, poor tracking may result in overshoot giving rise to “comet tails” in the image. The following images show indium aluminium nitride with small balls of indium on the surface. On the left the gains are set high enough for the scan rate, and tracking is good. On the right the gains are too low for the scan rate, and the tracking is poor. This results in overshooting off the edges of the indium dots, appearing in the image as comet tails. This can also be seen as the trace and retrace not overlapping.

    good_tracking.jpg comet_tails.jpg

    Good tracking

    Poor tracking, resulting in “comet tails

    However if the gains are set too high, then the feedback circuit can begin to oscillate. This causes high frequency noise.

    Amplitude error image for a scan with the gains set too high

    Amplitude error image for a scan with the gains set too high

    The precise values used for feedback gains will vary between instruments. A good rule of thumb is to increase the gain until excess noise begins to appear, and then reduce it slightly to get good tracking with low noise.

    Vibrations

    AFMs are very sensitive to external mechanical vibrations, which generally show up as horizontal bands in the image.

    Evidence of external vibrations

    Evidence of external vibrations in an amplitude error image

    These vibrations may be transmitted through the floor, for example from footsteps or the use of a lift. These can be minimised by the use of a vibrational isolation table, and locating the AFM on a ground floor or below.

    Acoustic noise such as people talking can also cause image artefacts, as can drafts of air. An acoustic hood can be used to minimise the effects of both of these.

    acoustic_hood_open.jpg

    Acoustic hood open

    acoustic_hood_closed.jpg

    Acoustic hood closed


    This page titled 3.9: Other Artefacts is shared under a CC BY-NC-SA 2.0 license and was authored, remixed, and/or curated by Dissemination of IT for the Promotion of Materials Science (DoITPoMS) via source content that was edited to the style and standards of the LibreTexts platform; a detailed edit history is available upon request.

    • Was this article helpful?