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Engineering LibreTexts

3: Atomic Force Microscopy

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https://www.doitpoms.ac.uk/tlplib/afm/index.php

Learning Objectives

  • Understand the basic principles of atomic force microscopy (AFM), including the different modes it can be used in.
  • Understand how AFM can be used in materials science.
  • Be aware of some of the problems that can be encountered, and how to overcome them.

Before You Start

You should have a basic understanding of the behaviour of piezoelectric materials to understand how the piezo-scanner works in AFM


This page titled 3: Atomic Force Microscopy is shared under a CC BY-NC-SA 2.0 license and was authored, remixed, and/or curated by Dissemination of IT for the Promotion of Materials Science (DoITPoMS) via source content that was edited to the style and standards of the LibreTexts platform.

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