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3.10: Summary

  • Page ID
    19843
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    Atomic force microscopy may be used to image the micro- and nano-scale morphology of a wide range of samples, including both conductive and insulating materials, and both soft and hard materials. Successful imaging requires optimisation of the feedback circuit which controls the cantilever height, and an understanding of the artefacts which may arise due to the nature of the instrument and any noise sources in its immediate environment. Despite these issues, atomic force microscopy is a powerful tool in the emerging discipline of nanotechnology.

    Going Further

    Books

    • Meyer, Hug and Bennewitz, Scanning Probe Microscopy: The Lab on a Tip, Springer, 2003

    Websites


    This page titled 3.10: Summary is shared under a CC BY-NC-SA license and was authored, remixed, and/or curated by Dissemination of IT for the Promotion of Materials Science (DoITPoMS).

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